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Search for "circular mode atomic force microscopy" in Full Text gives 1 result(s) in Beilstein Journal of Nanotechnology.
Exploring wear at the nanoscale with circular mode atomic force microscopy
Beilstein J. Nanotechnol. 2017, 8, 2662–2668, doi:10.3762/bjnano.8.266
- . Finally, we describe the advantages of this method and we report a relevant application example addressing a Cu/Al2O3 nanocomposite material used in industrial applications. Keywords: circular mode atomic force microscopy; composite materials; image processing; nanowear; wear mechanisms; Introduction
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